Transmitting device using calibration circuit, semiconductor apparatus and system including the same

ABSTRACT

A transmitting device includes a calibration circuit and a transmission circuit. The calibration circuit generates calibration codes by performing a calibration operation. The calibration circuit also generates compensation calibration codes by increasing or decreasing values of the calibration codes according to whether a number of codes among the calibration codes having a predetermined level is greater than or equal to a threshold value. The transmission circuit drives a signal transmission line based on an input signal and the compensation calibration codes.

CROSS-REFERENCES TO RELATED APPLICATION

The present application is a continuation application of U.S. patentapplication Ser. No. 15/970,444, filed on May 3, 2018, and claimspriority under 35 U.S.C. § 119(a) to Korean application number0-2017-0125274, filed on Sep. 27, 2017, in the Korean IntellectualProperty Office, which is incorporated herein by reference in itsentirety.

BACKGROUND 1. Technical Field

Various embodiments of the present invention relate to a semiconductortechnology and, more particularly, to a transmitting device using acalibration circuit, a semiconductor apparatus, and system including thetransmitting device.

2. Related Art

An electronic device includes many electronic elements, and a computersystem includes many electronic elements which include semiconductorapparatuses. Semiconductor apparatuses of computer systems may transmitdata through data transmission devices. As semiconductor apparatusesoperate at higher speeds while consuming less power, transmissionsignals may be distorted due to external noise and impedance mismatchingbetween semiconductor apparatuses communicating with each other,Therefore, semiconductor apparatuses perform an operation of matchingimpedances or resistances between data transmission devices.

Accordingly, a semiconductor apparatus generally includes an on-dietermination circuit configured to perform impedance matching foraccurate signal transmission. For precise impedance matching, asemiconductor apparatus should perform an operation of adjustingtermination resistance according to PVT variation. In general, a memorydevice is coupled to an external reference resistance and performs anoperation of adjusting an impedance value of the termination resistanceby performing a calibration operation using the external referenceresistance, which is generally referred to as a “ZQ calibrationoperation.”

SUMMARY

In accordance with the present teachings is a transmitting deviceincluding a calibration circuit configured to generate calibration codesby performing a calibration operation and configured to generatecompensation calibration codes by increasing or decreasing values of thecalibration codes when a number of codes among the calibration codeshaving a predetermined level is greater than or equal to a thresholdvalue. The transmitting device also includes a transmission circuitconfigured to drive a signal transmission line based on an input signaland the compensation calibration codes.

Also in accordance with the present teachings is a transmitting deviceincluding a calibration circuit configured to generate calibration codesby performing a calibration operation, configured to generate convertedcalibration codes by increasing or decreasing values of the calibrationcodes based on whether a number of codes among the calibration codeshaving a predetermined level is greater than or equal to a thresholdvalue, and configured to generate compensation calibration codes fromthe calibration codes or the converted calibration codes according to anoperation mode signal. The transmitting device further includes atransmission circuit configured to drive a signal transmission linebased on an input signal and the compensation calibration codes.

Further in accordance with the present teachings is a transmittingdevice including a calibration circuit configured to generatecalibration codes by performing a calibration operation and configuredto generate compensation calibration codes by changing the calibrationcodes when a number of codes among the calibration codes having apredetermined level is greater than or equal to a threshold value. Thetransmitting device also includes a transmission circuit configured todrive a signal transmission line based on an input signal and thecompensation calibration codes, wherein the transmission circuit incudesa main driver having a pull-up resistance and a pull-down resistance setbased on the compensation calibration codes.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG, 1 shows a schematic diagram illustrating a configuration of asemiconductor system in accordance with an embodiment of the presentdisclosure.

FIG. 2 shows a schematic diagram illustrating a configuration of atransmitting device in accordance with an embodiment of the presentdisclosure.

FIG. 3 shows a schematic diagram illustrating a configuration of thepre-driver shown in FIGS. 2.

FIG. 4 shows a schematic diagram illustrating a configuration of themain driver shown in FIG. 2.

FIG. 5 shows a schematic diagram illustrating a configuration of thecalibration circuit shown in FIG. 2.

FIG. 6 shows a schematic diagram illustrating a configuration of acalibration code converter in accordance with an embodiment of thepresent disclosure.

FIGS. 7A and 7B show a table illustrating a method of operation of thecode decoder shown in FIG. 6.

DETAILED DESCRIPTION

Various disclosed embodiments provide a calibration circuit, capable ofgenerating a calibration code suitable to operation modes of asemiconductor apparatus having a transmitting circuit or a semiconductorsystem having multiple transmitting circuits.

In accordance with the present teachings is a transmitting deviceincluding a calibration circuit configured to generate calibration codesby performing a calibration operation and configured to generatecompensation calibration codes by increasing or decreasing values of thecalibration codes when a number of codes among the calibration codeshaving a predetermined level is greater than or equal to a thresholdvalue. The transmitting device also includes a transmission circuitconfigured to drive a signal transmission line based on an input signaland the compensation calibration codes.

In one embodiment, the calibration circuit includes a calibration codegenerator coupled to an external reference resistance, wherein thecalibration code generator is configured to generate the calibrationcodes. The calibration circuit also includes a calibration codeconverter configured to generate converted calibration codes from thecalibration codes and configured to select the calibration codes or theconverted calibration codes as the compensation calibration codes basedon an operation mode signal. In some instances, the operation modesignal provides an indication that a semiconductor apparatus associatedwith the transmission circuit is operating in a low power mode. For onecase, the operation mode signal is enabled when the semiconductorapparatus associated with the transmission circuit is operating in thelow power mode.

In a further embodiment, the calibration code converter includes a codedecoder configured to generate the converted calibration codes byincreasing or decreasing values of the calibration codes when the numberof codes among the calibration codes having the predetermined level isgreater than or equal to the threshold value. The calibration codeconverter also includes a code selector configured to output thecalibration codes or the converted calibration codes as the compensationcalibration codes based on the operation mode signal.

In another embodiment, the compensation calibration codes includecompensation pull-up calibration codes and compensation pull-downcalibration codes. Further, the transmission circuit includes apre-driver configured to generate a plurality of pull-up signals basedon the input signal and the compensation pull-up calibration codes andconfigured to generate a plurality of pull-down signals based the inputsignal and the compensation pull-down calibration codes. Thetransmission circuit also includes a main driver configured to drive thesignal transmission line based on the plurality of pull-up signals andthe plurality of pull-down signals,

For a further embodiment, a pull-up resistance and a pull-up drivingforce of the main driver are adjusted based on the plurality of pull-upsignals. Also, a pull-down resistance and a pull-down driving force ofthe main driver are adjusted based on the plurality of pull-downsignals.

Also in accordance with the present teachings is a transmitting deviceincluding a calibration circuit configured to generate calibration codesby performing a calibration operation, configured to generate convertedcalibration codes by increasing or decreasing values of the calibrationcodes based on whether a number of codes among the calibration codeshaving a predetermined level is greater than or equal to a thresholdvalue, and configured to generate compensation calibration codes fromthe calibration codes or the converted calibration codes according to anoperation mode signal. The transmitting device further includes atransmission circuit configured to drive a signal transmission linebased on an input signal and the compensation calibration codes.

In one embodiment, the calibration circuit is configured to generate theconverted calibration codes by incrementally increasing or decreasingvalues of the calibration codes until the number of codes among thecalibration codes having the predetermined level is less than thethreshold value. In another embodiment, the calibration circuit includesa calibration code generator coupled to an external referenceresistance, wherein the calibration code generator is configured togenerate the calibration codes. The calibration circuit also includes acalibration code converter configured to generate the convertedcalibration codes from the calibration codes and configured to generatethe compensation calibration codes from the calibration codes or theconverted calibration codes based on the operation mode signal.

For a further embodiment, the calibration code converter includes a codedecoder configured to generate the converted calibration codes byincreasing or decreasing values of the calibration codes when the numberof codes among the calibration codes having the predetermined level isgreater than or equal to the threshold value. The calibration codeconverter also includes a code selector configured to output thecalibration codes or the converted calibration codes as the compensationcalibration codes based on the operation mode signal.

In one embodiment, the transmission circuit of the transmitting deviceincludes a pre-driver configured to generate a plurality of pull-upsignals and a plurality of pull-down signals based on the input signaland the compensation calibration codes. The transmission circuit alsoincludes a main driver configured to drive the signal transmission linebased on the plurality of pull-up signals and the plurality of pull-downsignals. For a further embodiment, a pull-up resistance and a pull-updriving force of the main driver are adjusted based on the plurality ofpull-up signals. Also, a pull-down resistance and a pull-down drivingforce of the main driver are adjusted based on the plurality ofpull-down signals,

Further in accordance with the present teachings is a transmittingdevice including a calibration circuit configured to generatecalibration codes by performing a calibration operation and configuredto generate compensation calibration codes by changing the calibrationcodes when a number of codes among the calibration codes having apredetermined level is greater than or equal to a threshold value. Thetransmitting device also includes a transmission circuit configured todrive a signal transmission line based on an input signal and thecompensation calibration codes, wherein the transmission circuitincludes a main driver having a pull-up resistance and a pull-downresistance set based on the compensation calibration codes.

In one embodiment, the calibration circuit is configured to generate thecompensation calibration codes by incrementally increasing or decreasingvalues of the calibration codes such that the pull-up resistance and thepull-down resistance of the main driver set based on the convertedcalibration codes become most adjacent to a pull-up resistance value anda pull-down resistance value, respectively, that would otherwise be setbased on the calibration codes. In another embodiment, the calibrationcircuit includes a calibration code generator coupled to an externalreference resistance, wherein the calibration code generator isconfigured to generate the calibration codes. The calibration circuitalso includes a calibration code converter configured to generateconverted calibration codes by increasing or decreasing values of thecalibration codes when the number of codes among the calibration codeshaving the predetermined level is greater than or equal to the thresholdvalue. The calibration code converter is further configured to generatethe compensation calibration codes from the calibration codes and theconverted calibration codes based on an operation mode signal.

For one embodiment, the calibration code converter includes a codedecoder configured to generate the converted calibration codes byincreasing or decreasing values of the calibration codes when the numberof codes among the calibration codes having the predetermined level isgreater than or equal to the threshold value. The calibration codeconverter also includes a code selector configured to output thecalibration codes or the converted calibration codes as the compensationcalibration codes based on the operation mode signal.

In another embodiment, the transmission circuit of the transmittingdevice further includes a pre-driver configured to generate a pluralityof pull-up signals and a plurality of pull-down signals based on theinput signal and the compensation calibration codes. The main driver isconfigured to drive the signal transmission line based on the pluralityof pull-up signals and the plurality of pull-down signals. For a furtherembodiment, the pull-up resistance set based on the convertedcalibration codes and a pull-up driving force of the main driver areadjusted based on the plurality of pull-up signals. Also, the pull-downresistance set based on the converted calibration codes and a pull-downdriving force of the main driver are adjusted based on the plurality ofpull-down signals.

Hereinafter, a semiconductor apparatus according to the presentinvention will be described below with reference to the accompanyingdrawings through exemplary embodiments.

FIG. 1 shows a schematic diagram illustrating a configuration of asemiconductor system 1 in accordance with an embodiment of the presentdisclosure. Referring to FIG. 1, the system 1 may include a firstsemiconductor apparatus 110 and a second semiconductor apparatus 120.The first semiconductor apparatus 110 and the second semiconductorapparatus 120 may communicate with each other. In an embodiment, thefirst semiconductor apparatus 110 may be a master apparatus and thesecond semiconductor apparatus 120 may be a slave apparatus controlledby the first semiconductor apparatus 110. For example, the firstsemiconductor apparatus 110 may be a host apparatus, such as a processoror a controller, and may include a central processing unit (CPU), agraphic processing unit (GPU), a multi-media processor (MMP), a digitalsignal processor, and/or a memory controller. The first semiconductorapparatus 110 may be implemented in the form of a system on chip bycombining multi-purpose processor chips such as an application processor(AP). The second semiconductor apparatus 120 may be a memory device andmay include a volatile memory and a non-volatile memory. The volatilememory may include a static RAM (SRAM), a dynamic RAM (DRAM), and/or asynchronous DRAM (SDRAM). The non-volatile memory may include a readonly memory (ROM), a programmable ROM (PROM), an electrically erase andprogrammable ROM (EEPROM), an electrically programmable ROM (EPROM), aflash memory, a phase change RAM (PRAM), a magnetic RAM (MRAM), aresistive RAM (RRAM), a ferroelectric RAM (FRAM), and so forth.

The first and second semiconductor apparatuses 110 and 120 may becoupled to each other through a signal transmission line 130. The firstsemiconductor apparatus 110 may include a pad 111, which may be coupledto the signal transmission line 130. The second semiconductor apparatus120 may include a pad 121, which may be coupled to the signaltransmission line 130. The signal transmission line 130 may be achannel, a link, or a bus. The first semiconductor apparatus 110 mayinclude a transmission circuit 112 and a reception circuit 113. Thetransmission circuit 112 may be configured to transmit a signal from thefirst semiconductor apparatus 110 to the second semiconductor apparatus120 through the signal transmission line 130. The reception circuit 113may be configured to receive a signal from the second semiconductorapparatus 120 through the signal transmission line 130. In similar way,the second semiconductor apparatus 120 may include a transmissioncircuit 122 and a reception circuit 123. The transmission circuit 122may be configured to transmit a signal from the second semiconductorapparatus 120 to the first semiconductor apparatus 110 through thesignal transmission line 130. The reception circuit 123 may beconfigured to receive a signal from the first semiconductor apparatus110 through the signal transmission line 130. In an embodiment, thesignal transmission line 130 may be a data transmission line and thesignal transmitted through the signal transmission line 130 may be data.

The first and second semiconductor apparatuses 110 and 120 may furtherinclude calibration circuits 114 and 124, respectively. The calibrationcircuits 114 and 124 may be coupled to an external reference resistanceZQ and may perform calibration operations. By performing calibrationoperations, the calibration circuits 114 and 124 may set resistancevalues of the transmission circuits 112 and 122, respectively. Forexample, the resistance values of the transmission circuits 112 and 122may be set to 48 ohms, 60 ohms, 120 ohms, or 240 ohms according toresults of the calibration operations. The transmission circuits 112 and122 may have pull-up resistance values and/or a pull-up driving forcefor driving the signal transmission line 130 at a high level. Thetransmission circuits 112 and 122 may have pull-down resistance valuesand/or a pull-down driving force for driving the signal transmissionline 130 at a low level. The pull-up resistance values and/or thepull-up driving force and the pull-down resistance values and/or thepull-down driving force of the transmission circuits 112 and 122 may beset according to results of the calibration operations. The calibrationcircuits 114 and 124 and the transmission circuits 112 and 122 may forma transmitting device.

FIG. 2 shows a schematic diagram illustrating a configuration of atransmitting device 200 in accordance with an embodiment of the presentdisclosure. The transmitting device 200 may be implemented through acombination of the calibration circuits 114 and 124 and the transmissioncircuits 112 and 122. Referring to FIG. 2, the transmitting device 200may include a calibration circuit 210 and a transmission circuit 220.The calibration circuit 210 may generate calibration codes by performinga calibration operation. The calibration circuit 210 may be coupled tothe external reference resistance ZQ. The calibration codes may includepull-up calibration codes and pull-down calibration codes. Thecalibration circuit 210 may generate compensation calibration codesCCAL<1 :n> (n is an integer of 2 or more) by changing the calibrationcodes. The calibration circuit 210 may generate compensation calibrationcodes CPCAL<1 :n> by changing the pull-up calibration codes. Thecalibration circuit 210 may generate compensation calibration codesCNCAL<1 :n> by changing the pull-down calibration codes.

The calibration circuit 210 may determine whether a number of codesamong the calibration codes having a predetermined level is greater thanor equal to a threshold value. The calibration circuit 210 may receivethreshold value information NSW used to set the threshold value. For anembodiment, the threshold value may be dynamically set based onthreshold value information NSW that changes as a function of time. Thecalibration circuit 210 may change values of the calibration codes whena number of codes among the calibration codes having the predeterminedlevel is greater than or equal to the threshold value. For someembodiments, the calibration circuit 210 does not change values of thecalibration codes when a number of codes among the calibration codeshaving the predetermined level is less than the threshold value. Thecalibration circuit 210 may generate the compensation calibration codesCCAL<1:n> by changing the calibration codes according to whether anumber of codes among the calibration codes having the predeterminedlevel is greater than or equal to the threshold value. The calibrationcircuit 210 may generate the compensation calibration codes CCAL<1:n> byincreasing or decreasing values of the calibration codes when a numberof codes among the calibration codes having the predetermined level isgreater than or equal to the threshold value. The calibration circuit210 may generate the compensation calibration codes CCAL<1:n> bymaintaining the calibration codes when a number of codes among thecalibration codes having the predetermined level is less than thethreshold value among the calibration codes.

The calibration circuit 210 may further receive an operation mode signalZCCS. For some embodiments, the operation mode signal ZCCS provides anindication that the first semiconductor apparatus 110 and/or the secondsemiconductor apparatus 120 is operating in a particular mode, such as alow power mode. For example, the operation mode signal ZCCS may beenabled based on an operation mode of the first semiconductor apparatus110 and/or the second semiconductor apparatus 120 shown in FIG. 1. Inone case, the operation mode signal ZCCS may be enabled when the firstsemiconductor apparatus 110 or the second semiconductor apparatus 120operates in the low power mode. The operation mode signal ZCCS may bedisabled when the first semiconductor apparatus 110 or the secondsemiconductor apparatus 120 is not operating in the low power mode. Inanother embodiment, the operation mode signal ZCCS is enabled with oneof multiple states, wherein each state indicates a different operationmode of the first semiconductor apparatus 110 and/or the secondsemiconductor apparatus 120. For instance, if the operation mode signalZCCS is enabled with a first voltage, then the first semiconductorapparatus 110 is operating in a low power mode. If the operation modesignal ZCCS is enabled with a second voltage, then the firstsemiconductor apparatus 110 is operating in a normal power mode.

The first semiconductor apparatus 110 and/or the second semiconductorapparatus 120 may be implemented as various electrical devices. Althoughnot limited, the first semiconductor apparatus 110 or the secondsemiconductor apparatus 120 may require the low power mode when thefirst semiconductor apparatus 110 or the second semiconductor apparatus120 is a portable electrical device using a battery. The calibrationcircuit 210 may generate the compensation calibration codes CCAL<1:n> bychanging the calibration codes according to whether a number of codesamong the calibration codes having the predetermined level is greaterthan or equal to the threshold value. The calibration circuit 210 maygenerate the compensation calibration codes CCAL<1:n> by increasing ordecreasing values of the calibration codes according to whether a numberof codes among the calibration codes having the predetermined level isgreater than or equal to the threshold value. The calibration circuit210 may generate the compensation calibration codes CCAL<1:n> bymaintaining the calibration codes according to whether a number of codesamong the calibration codes having the predetermined level is less thanthe threshold value. The calibration circuit 210 may output one of thecalibration codes and the converted calibration codes as thecompensation calibration codes CCAL<1:n> based on the operation modesignal ZCCS. The calibration circuit 210 may output the convertedcalibration codes as the compensation calibration codes CCAL<1:n> whenthe first semiconductor apparatus 110 or the second semiconductorapparatus 120 including the calibration circuit 210 operates in the lowpower mode. The calibration circuit 210 may output the calibration codesas the compensation calibration codes CCAL<1:n> when the firstsemiconductor apparatus 110 or the second semiconductor apparatus 120including the calibration circuit 210 is not operating in the low powermode.

The transmission circuit 220 may drive a signal transmission line 203based on an input signal IN and the compensation calibration codesCCAL<1:n>. The transmission circuit 220 may be coupled to the signaltransmission line 203 through a pad 201. The transmission circuit 220may drive the signal transmission line 203 to a level corresponding tothe input signal IN based on the input signal IN and the compensationcalibration codes CCAL<1:n>.

The transmission circuit 220 may include a pre-driver 221 and a maindriver 222. The pre-driver 221 may generate a plurality of pull-upsignals PU<1:n> and a plurality of pull-down signals PD<1:n> based onthe input signal IN and the compensation calibration codes CCAL<1:n>.The pre-driver 221 may generate the plurality of pull-up signals PU<1:n>based on the input signal IN and the compensation calibration codesCPCAL<1:n>. The pre-driver 221 may generate the plurality of pull-downsignals PD<1:n> based on the input signal IN and the compensationcalibration codes CNCAL<1:n>.

The main driver 222 may receive the plurality of pull-up signals PU<1:n>and the plurality of pull-down signals PD<1:n>. The main driver 222 maydrive the signal transmission line 203 based on the plurality of pull-upsignals PU<1:n> and the plurality of pull-down signals PD<1:n>. Apull-up resistance value and/or a pull-up driving force of the maindriver 222 may be set based on the plurality of pull-up signals PU<1:n>,A pull-down resistance value and/or a pull-down driving force of themain driver 222 may be set based on the plurality of pull-down signalsPD<1:n>.

FIG. 3 shows a schematic diagram illustrating configuration of thepre-driver 221 shown in FIG. 2. Referring to FIG. 3, the pre-driver 221may include a first pre-driver 310 and a second pre-driver 320. Thefirst pre-driver 310 may generate the plurality of pull-up signalsPU<1:n> based on the input signal IN and the compensation calibrationcodes CPCAL<1:n>. The second pre-driver 320 may generate the pluralityof pull-down signals PD<1:n> based on the input signal IN and thecompensation calibration codes CNCAL<1:n>.

The first pre-driver 310 may include a plurality of AND gates 311 to 31n . The plurality of AND gates 311 to 31 n may receive the input signalIN and the compensation calibration codes CPCAL<1:n>, The plurality ofAND gates 311 to 31 n may enable the plurality of pull-up signalsPU<1:n> when both of the input signal IN and the compensationcalibration codes CPCAL<1:n> have a high level.

The second pre-driver 320 may include a plurality of AND gates 321 to 32n . The plurality of AND gates 321 to 32 n may receive an invertedsignal of the input signal IN and the compensation calibration codesCNCAL<1:n>. The input signal IN may be inverted by the inverter 330prior to being outputted to the plurality of AND gates 321 to 32 n . Theplurality of AND gates 321 to 32 n may enable the plurality of pull-downsignals PD<1:n> when both of the inverted signal of the input signal INand the compensation calibration codes CNCAL<1:n> have a high level.

FIG. 4 shows a schematic diagram illustrating a configuration of themain driver 222 shown in FIG. 2. Referring to FIG. 4, the main driver222 may include a pull-up driver 410 and a pull-down driver 420. Thepull-up driver 410 may be coupled between a node of a power voltage VDDQand an output node ON. The output node ON may be coupled to the signaltransmission line 203. A resistance value and/or a driving force of thepull-up driver 410 may be determined according to the plurality ofpull-up signals PU<1:n>. The pull-up driver 410 may pull-up drive theoutput node ON to the power voltage VDDQ according to the plurality ofpull-up signals PU<1:n>. The pull-down driver 420 may be coupled betweena node of a ground voltage VSSQ and the output node ON. A resistancevalue and/or a driving force of the pull-down driver 420 may bedetermined according to the plurality of pull-down signals PD<1:n>. Thepull-down driver 420 may pull-down drive the output node ON to theground voltage VSSQ according to the plurality of pull-down signalsPD<1:n>. The pull-up driver 410 and the pull-down driver 420 maygenerate the output signal OUT by pull-up driving and pull-down drivingthe output node ON, respectively.

The pull-up driver 410 may include a plurality of transistors 411 to 41n . For some embodiments, the plurality of transistors 411 to 41 n maybe N-channel MOS transistors. In other embodiments, the plurality oftransistors 411 to 41 n may be P-channel MOS transistors. A number oftransistors included in the pull-up driver 410 may correspond to anumber of codes included in the compensation calibration codesCPCAL<1:n>. A first transistor 411 may receive a pull-up signal PU<1> atits gate, may be coupled to the node of the power voltage VDDQ at itsdrain, and may be coupled the output node ON at its source. A secondtransistor 412 may receive a pull-up signal PU<2> at its gate, may becoupled to the node of the power voltage VDDQ at its drain, and may becoupled to the output node ON at its source. An n^(th) transistor 41 nmay receive a pull-up signal PU<n> at its gate, may be coupled to thenode of the power voltage VDDQ at its drain, and may be coupled to theoutput node ON at its source.

The pull-down driver 420 may include a plurality of transistors 421 to42 n . In some embodiments, the plurality of transistors 421 to 42 n maybe N-channel MOS transistors. In other embodiments, the plurality oftransistors 421 to 42 n may be P-channel MOS transistors. The pull-downdriver 420 may include transistors, a number of which corresponds to anumber of codes included in the compensation calibration codesCNCAL<1:n>. A first transistor 421 may receive a pull-down signal PD<1>at its gate, may be coupled to the node of the ground voltage VSSQ atits source, and may be coupled to the output node ON at its drain. Asecond transistor 422 may receive a pull-down signal PD<2> at its gate,may be coupled to the node of the ground voltage VSSQ at its source, andmay be coupled to the output node ON at its drain. An n^(th) transistor42 n may receive a pull-down signal PD<n> at its gate, may be coupled tothe node of the ground voltage VSSQ at its source, and may be coupled tothe output node ON at its drain.

The resistance value and/or the driving force of the pull-up driver 410may vary according to a number of pull-up signals PU<1:n>. Theresistance value and/or the driving force of the pull-down driver 420may vary according to a number of pull-down signals PD<1:n>. As a numberof enabled pull-up signals and pull-down signals become greater, agreater number of the transistors may be turned on and power consumptionof the main driver 222 may increase. As a number of enabled pull-upsignals and pull-down signals become smaller, a smaller number of thetransistors may be turned on and power consumption of the main driver222 may decrease.

FIG. 5 shows a schematic diagram illustrating a configuration of thecalibration circuit 210 shown in FIG. 2. Referring to FIG. 5, thecalibration circuit 210 may include a calibration code generator 510 anda calibration code converter 520. The calibration code generator 510 maybe coupled to the external reference resistance ZQ and may generate thecalibration codes. The calibration codes may include pull-up calibrationcodes PCAL<1:n> and pull-down calibration codes NCAL<1:n>. Thecalibration code generator 510 may be coupled to the external referenceresistance ZQ through a reference resistance pad 501.

The calibration code converter 520 may receive the calibration codesPCAL<1:n> and NCAL<1:n> generated by the calibration code generator 510.Also, the calibration code converter 520 may receive the threshold valueinformation NSW and the operation mode signal ZCCS. The calibration codeconverter 520 may generate converted calibration codes SPCAL<1:n> andSNCAL<1:n> by increasing or decreasing values of the calibration codesPCAL<1:n> and NCAL<1:n> when a number of codes having the predeterminedlevel is greater than or equal to the threshold value. For anembodiment, the threshold value is based on the threshold valueinformation NSW received by the calibration code converter 520 inaddition to the calibration codes PCAL<1:n> and NCAL<1:n>. Thecalibration code converter 520 may generate converted pull-upcalibration codes SPCAL<1:n> by increasing or decreasing values of thepull-up calibration codes PCAL<1:n> when a number of codes having thepredetermined level is greater than or equal to the threshold value forthe pull-up calibration codes PCAL<1:n>. The calibration code converter520 may generate converted pull-down calibration codes SNCAL<1:n> byincreasing or decreasing values of the pull-down calibration codesNCAL<1:n> when a number of codes having the predetermined level isgreater than or equal to the threshold value for the pull-downcalibration codes NCAL<1:n>.

The calibration code converter 520 may output one of the calibrationcodes PCAL<1:n> and NCAL<1:n> and the converted calibration codesSPCAL<1:n> and SNCAL<1:n> as compensation calibration codes CPCAL<1:n>and CNCAL<1:n> based on the operation mode signal ZCCS. When theoperation mode signal ZCCS is enabled, the calibration code converter520 may output the converted calibration codes SPCAL<1:n> and SNCAL<1:n>as the compensation calibration codes CPCAL<1:n> and CNCAL<1:n>. Whenthe operation mode signal ZCCS is enabled, the calibration codeconverter 520 may output the converted pull-up calibration codesSPCAL<1:n> as adjusted pull-up calibration codes CPCAL<1:n> and mayoutput the converted pull-down calibration codes SNCAL<1:n> as adjustedpull-down calibration codes CNCAL<1:n>. When the operation mode signalZCCS is disabled, the calibration code converter 520 may output thecalibration codes PCAL<1:n> and NCAL<1:n> as the compensationcalibration codes CPCAL<1:n> and CNCAL<1:n>. When the operation modesignal ZCCS is disabled, the calibration code converter 520 may outputthe pull-up calibration codes PCAL<1:n> as the adjusted pull-upcalibration codes CPCAL<1:n> and may output the pull-down calibrationcodes NCAL<1:n> as the adjusted pull-down calibration codes CNCAL<1:n>.

The calibration code generator 510 may include a reference resistanceleg RL, a first comparator 511, a pull-down code generator 512, apull-down resistance PDR, a pull-up resistance PUR, a second comparator513, and a pull-up code generator 514. The reference resistance leg RLmay be coupled to the external reference resistance ZQ through thereference resistance pad 501. For example, the external referenceresistance ZQ may be coupled to the power voltage VDDQ, and thereference resistance leg RL may be a pull-down resistance coupled to theground voltage VSS. In an embodiment, the external reference resistanceZQ may be coupled to the ground voltage VSS, and the referenceresistance leg RL may be a pull-up resistance coupled to the powervoltage VDDQ. The first comparator 511 may compare levels of a referencevoltage VREF and a voltage in accordance with a resistance ratio betweenthe external reference resistance ZQ and the reference resistance legRL. The reference voltage VREF may have half the level of the powervoltage VDDQ of the calibration circuit 210. The pull-down codegenerator 512 may generate the pull-down calibration codes NCAL<1:n>based on the comparison result of the first comparator 511. For example,the pull-down code generator 512 may increase or decrease values of thepull-down calibration codes NCAL<1:n> based the comparison result of thefirst comparator 511. The pull-down resistance PDR may receive thepull-down calibration codes NCAL<1:n> and may have a variable resistancevalue based on the pull-down calibration codes NCAL<1:n>.

The pull-up resistance PUR may be coupled to the pull-down resistancePDR. The second comparator 513 may compare levels of the referencevoltage VREF and a voltage based on a resistance ratio between thepull-up resistance PUR and the pull-down resistance PDR. The pull-upcode generator 514 may generate the pull-up calibration codes PCAL<1:n>according to the comparison result of the second comparator 513. Forexample, the pull-up code generator 514 may increase or decrease valuesof the pull-up calibration codes PCAL<1:n> based on the comparisonresult of the second comparator 513. The pull-up resistance PUR mayreceive the pull-up calibration codes PCAL<1:n> and may have a variableresistance value based on the pull-up calibration codes PCAL<1:n>. In anembodiment, the calibration code generator 510 may first set the pull-upcalibration codes PCAL<1:n> and then set the pull-down calibration codesNCAL<1:n> based on the previously set pull-up calibration codesPCAL<1:n>.

FIG. 6 shows a schematic diagram illustrating a configuration of acalibration code converter 620 in accordance with an embodiment of thepresent disclosure. For some embodiments the calibration code converter620 may represent the calibration code converter 520 shown in FIG. 5.Referring to FIG. 6, the calibration code converter 620 may include acode decoder 621 and a code selector 622. The code decoder 621 mayreceive the calibration codes CAL<1:n> and the threshold valueinformation NSW. The code decoder 621 may generate the convertedcalibration codes SCAL<1:n> by increasing or decreasing values of thecalibration codes CAL<1:n> when a number of codes among the calibrationcodes having the predetermined level is greater than or equal to thethreshold value. An operation of the code decoder 621 of the calibrationcode converter 620 will be described later. In an embodiment, thecalibration code converter 620 may receive the pull-up calibration codesPCAL<1:n> and the pull-down calibration codes NCAL<1:n> to generate theadjusted pull-up calibration codes CPCAL<1:n> and the adjusted pull-downcalibration codes CNCAL<1:n>. In an embodiment, two (2) calibration codeconverters may be provided to generate the adjusted pull-up calibrationcodes CPCAL<1:n> from the pull-up calibration codes PCAL<1:n> andgenerate the adjusted pull-down calibration codes CNCAL<1:n> from thepull-down calibration codes NCAL<1:n>. For example, a first calibrationcode converter generates the adjusted pull-up calibration codesCPCAL<1:n> from the pull-up calibration codes PCAL<1:n>, and a secondcalibration code converter generates the adjusted pull-down calibrationcodes CNCAL<1:n> from the pull-down calibration codes NCAL<1:n>.

The code selector 622 may receive the calibration codes CAL<1:n>, theconverted calibration codes SCAL<1:n>, and the operation mode signalZCCS. The code selector 622 may output, based on the operation modesignal ZCCS, either the calibration codes CAL<1:n> or the convertedcalibration codes SCAL<1:n> as the compensation calibration codesCCAL<1:n>. The code selector 622 may be a multiplexor configured tooutput, based on the operation mode signal ZCCS, either the calibrationcodes CAL<1:n> or the converted calibration codes SCAL<1:n> as thecompensation calibration codes CCAL<1:n>. The code selector 622 mayoutput the converted calibration codes SCAL<1:n> as the compensationcalibration codes CCAL<1:n> when the operation mode signal ZCCS isenabled. The code selector 622 may output the calibration codes CAL<1:n>as the compensation calibration codes CCAL<1:n> when the operation modesignal ZCCS is disabled.

FIGS. 7A and 7B show a table illustrating an operation of the codedecoder 621 shown in FIG. 6. FIGS. 7A and 7B tabulate the six codes ofthe calibration codes CAL<1:6> and a sum SUM of a number of codes amongthe calibration codes CAL<1:6> having a high. When the calibration codesCAL<1:6> are 6-bit signals, the threshold value may be 4 for anembodiment. When a number of codes among the calibration codes CAL<1:6>having a high level is 4, the code decoder 621 may increase or decreasevalues of the calibration codes CAL<1:6> such that a number of codeshaving a high level is below 3. Also, the code decoder 621 may minimizeerrors between a resistance value of the main driver 222 set based onthe calibration codes CAL<1:6> and a resistance value of the main driver222 set based on converted calibration codes by converting thecalibration codes CAL<1:6> into the converted calibration codes havingvalues adjacent to the values of the calibration codes CAL<1:6>.

When the calibration codes CAL<1:6> are 6-bit signals, the calibrationcodes CAL<1:6> may have any one of 64 (2⁶) different sets of codevalues. FIGS. 7A and 7B show the 64 possible sets of code values, witheach row of the table indicting a different set. The rows of codes arearranged in ascending order of a binary representation of the six codesof the calibration codes CAL<1:6>. As shown, the row numbers appearingin the first column indicate the binary value for the set of six codevalues for each row. Among the first 15 sets of calibration codes, asindicated by row number, a number (indicated in the SUM column of thetable) of codes having a high level (i.e., 1) is under 3. Thus, for anembodiment, the code decoder 621 does not convert values of the originalcalibration codes because the SUM is less than a threshold value of 4.

A number of codes having a high level is equal to the threshold value of4 for the 16^(th) set of calibration codes. Thus the code decoder 621may generate the converted calibration codes by increasing or decreasingvalues for the 16^(th) set of calibration codes. The code decoder 621may convert the 16^(th) set of calibration codes into the 15^(th) set ofcalibration codes or the 17^(th) set of calibration codes, each of whichhas 3 or less codes having a high level and each of which has valuesadjacent to the values of the 16^(th) set of calibration codes. The codedecoder 621 may output the 15^(th) set of calibration codes or the17^(th) set of calibration codes as the converted calibration codes ofthe 16^(th) set of calibration codes.

As shown, converting the values of the 16^(th) set of calibration codesto the values of the 17^(th) set of calibration codes represents anincrease in the values of the 16^(th) set of calibration codes. This isbecause the binary value for the set of six code values for row 17 isone greater than the binary value for the set of six code values for row16. Converting the values of the 16^(th) set of calibration codes to thevalues of the 15^(th) set of calibration codes represents a decrease inthe values of the 16^(th) set of calibration codes. This is because thebinary value for the set of six code values for row 15 is one less thanthe binary value for the set of six code values for row 16. In thiscase, rows 15 and 17 are immediately adjacent to the row 16. Rows 15 and17 are also the most adjacent rows to row 16 for which a number of codesamong the calibration codes CAL<1:6> having a high level is less thanthe threshold value of 4.

A number of codes having a high level is 4 among the 24^(th) set ofcalibration codes. Thus, the code decoder 621 may generate the convertedcalibration codes by increasing or decreasing values of the 24^(th) setof calibration codes. The code decoder 621 may convert the 24^(th) setof calibration codes into the 23^(th) set of calibration codes or the25^(th) set of calibration codes, each of which has 3 or less codeshaving a high level and each of which has values adjacent to the valuesof the 24^(th) set of calibration codes. The code decoder 621 may outputthe 23^(th) set of calibration codes or the 25^(th) set of calibrationcodes as the converted calibration codes of the 24^(th) set ofcalibration codes.

In similar way, the code decoder 621 may convert the 28^(th) set ofcalibration codes, the 40^(th) set of calibration codes, the 44^(th) setof calibration codes, and the 52^(nd) set of calibration codes into the27^(th) set of calibration codes or the 29^(th) set of calibrationcodes, the 39^(th) set of calibration codes or the 41^(st) set ofcalibration codes, the 43^(rd) set of calibration codes or the 45^(th)set of calibration codes, and the 51^(st) set of calibration codes orthe 53r^(d) set of calibration codes, respectively. The code decoder 621may output the 27 ^(th) set of calibration codes or the 29^(th) set ofcalibration codes, the 39^(th) set of calibration codes or the41^(st)set of calibration codes, the 43^(rd) set of calibration codes orthe 45^(th) set of calibration codes and the 51^(st) set of calibrationcodes or the 53^(rd) set of calibration codes as the convertedcalibration codes of the 28^(th) set of calibration codes, the 40^(th)set of calibration codes, the 44^(th) set of calibration codes and the52^(nd) set of calibration codes, respectively.

The consecutive 30^(th) to 32^(nd) sets of calibration codes all have 4or more codes having a high level, as indicated by the SUM column.Specifically, the 30^(th), 31^(st), and 32^(nd) sets of calibrationcodes have SUMs of 4, 4, and 5, respectively. Therefore, the codedecoder 621 converts the 30^(th) to 32^(nd) sets of calibration codesinto the 29^(th) or 33^(rd) set of calibration codes, each of which has3 or less codes having a high level and each of which has valuesadjacent to the values of the 30^(th) to 32^(nd) sets of calibrationcodes. The code decoder 621 outputs the converted calibration codes inorder to minimize errors between a resistance value of the main driver222 set based on the 30^(th) to 32^(nd) sets of calibration codes and aresistance value of the main driver 222 set based on the convertedcalibration codes. The code decoder 621 may output the 29^(th) or33^(rd) set calibration codes as the converted calibration codes of the30^(th) to 32^(nd) sets of calibration codes.

The 46^(th) to 48^(th) sets of calibration codes, each of which has asum of 4 or more, may be converted into the 45^(th) or 49^(th) set ofcalibration codes. The 54^(th) to 56^(th) sets of calibration codes,each of which has a sum of 4 or more, may be converted into the 53^(rd)or 57^(th) set of calibration codes. The 58^(th) to 64^(th) sets ofcalibration codes, each of which has a sum of 4 or more, may beconverted into the 57^(th) set of calibration codes.

Although FIGS. 7A and 7B illustrates an example of a conversion methodfor the calibration codes CAL<1:6> performed by the code decoder 621,the present teachings are not limited to the illustrated conversionmethod. For an embodiment, the code decoder 621 incrementally increasesor decreases values of the calibration codes CAL<1:6> until thecalibration codes CAL<1:6> are converted such that a number of codeshaving the predetermined level is less than the threshold value.

Described hereinafter with reference to FIGS. 2 to 6 is an operation ofthe transmitting device 200 in accordance with an embodiment of thepresent disclosure. The calibration code generator 510 may perform acalibration operation by using the external reference resistance ZQ togenerate the pull-up calibration codes PCAL<1:n> and the pull-downcalibration codes NCAL<1:n>. The code decoder 621 of the calibrationcode converter 520 may generate the converted pull-up calibration codesSPCAL<1:n>. For the converted pull-up calibration codes SPCAL<1:n>, thenumber of codes having a predetermined level is less than a thresholdvalue. To get the converted pull-up calibration codes SPCAL<1:n>, thecode decoder 621 increases or decreases values of the pull-upcalibration codes PCAL<1:n> when a number of codes having thepredetermined level is greater than or equal to the threshold valueamong the pull-up calibration codes PCAL<1:n>. For an embodiment, thethreshold value is based on the threshold value information NSW. Thecode decoder 621 of the calibration code converter 520 may generate theconverted pull-down calibration codes SNCAL<1:n>. For convertedpull-down calibration codes SNCAL<1:n>, the number of codes having thepredetermined level is less than the threshold value. To get theconverted pull-down calibration codes SNCAL<1:n>, the code decoder 621increases or decreases values of the pull-down calibration codesNCAL<1:n> when a number of codes having the predetermined level isgreater than or equal to the threshold value among the pull-downcalibration codes NCAL<1:n>. When a semiconductor apparatus includingthe transmitting device 200 operates in a low power mode, the operationmode signal ZCCS may be enabled. The code selector 622 of thecalibration code converter 520 may output the converted pull-upcalibration codes SPCAL<1:n> as the adjusted pull-up calibration codesCPCAL<1:n> based on the enabled operation mode signal ZCCS. The codeselector 622 of the calibration code converter 520 may output theconverted pull-down calibration codes SNCAL<1:n> as the adjustedpull-down calibration codes CNCAL<1:n> based on the enabled operationmode signal ZCCS. The pre-driver 221 may generate the plurality ofpull-up signals PU<1:n> based on the input signal IN and thecompensation calibration codes CPCAL<1:n>, which are generated from theconverted pull-up calibration codes SPCAL<1:n>. The pre-driver 221 maygenerate the plurality of pull-down signals PD<1:n> according to theinput signal IN and the compensation calibration codes CNCAL<1:n>, whichare generated from the converted pull-down calibration codes SNCAL<1:n>.Therefore, a number of enabled pull-up signals PU<1:n> and enabledpull-down signals PD<1:n> may be less than the threshold value and thepower consumption of the main driver 222 for driving the signaltransmission line 203 may be limited. Herein, there may be an errorbetween a resistance value of the main driver 222 set according to thecalibration codes PCAL<1:n> and NCAL<1:n> and a resistance value of themain driver 222 set according to the converted calibration codesSPCAL<1:n> and SNCAL<1:n>. However, since the calibration code converter520 generates the converted calibration codes SPCAL<1:n> and SNCAL<1:n>having values adjacent to values of the calibration codes PCAL<1:n> andNCAL<1:n>, the resistance value error of the main driver 222 may beminimized.

When a semiconductor apparatus including the transmitting device 200 isnot in the low power mode, the operation mode signal ZCCS may bedisabled. The code selector 622 of the calibration code converter 520may output the pull-up calibration codes PCAL<1:n> as the adjustedpull-up calibration codes CPCAL<1:n> based on the disabled operationmode signal ZCCS. The code selector 622 of the calibration codeconverter 520 may output the pull-down calibration codes NCAL<1:n> asthe adjusted pull-down calibration codes CNCAL<1:n> based on thedisabled operation mode signal ZCCS. The pre-driver 221 may generate theplurality of pull-up signals PU<1:n> based on the input signal IN andthe compensation calibration codes CPCAL<1:n>, which are generated fromthe pull-up calibration codes PCAL<1:n>. The pre-driver 221 may generatethe plurality of pull-down signals PD<1:n> based on the input signal INand the compensation calibration codes CNCAL<1:n>, which are generatedfrom the pull-down calibration codes NCAL<1:n>. Therefore, theresistance value of the main driver 222 may be precisely set without anerror according to the pull-up signals PU<1:n> and the pull-down signalsPD<1:n> generated on the basis of the pull-up calibration codesPCAL<1:n> and the pull-down calibration codes NCAL<1:n>, Although thepower consumption of the main driver 222 for driving the signaltransmission line 203 might not be limited, a signal may be transmittedwithout an error through the signal transmission line 203.

While certain embodiments have been described above for illustrativepurposes, it will be understood by those skilled in the art that thedisclosed embodiments represent only a subset of possible embodimentsconsistent with the present teachings. Accordingly, a transmittingdevice using calibration circuit or a semiconductor apparatus and systemincluding the same should not be limited based on the describedembodiments. Rather, the transmitting device using the calibrationcircuit and the semiconductor apparatus and system including the sameshould only be limited in light of the claims that follow when taken inconjunction with the written description and the accompanying drawings.

What is claimed is:
 1. A transmitting device comprising: a calibrationcircuit configured to generate calibration codes by performing acalibration operation and configured to generate compensationcalibration codes by increasing or decreasing values of the calibrationcodes based on whether a number of codes among the calibration codeshaving a predetermined level is greater than or equal to a thresholdvalue, such that a number of codes among the compensation calibrationcodes having the predetermined level is less than the threshold value;and a transmission circuit configured to drive a signal transmissionline based on an input signal and the compensation calibration codes. 2.The transmitting device of claim 1, wherein the calibration circuitcomprises: a calibration code generator coupled to an external referenceresistance and configured to generate the calibration codes; and acalibration code converter configured to generate converted calibrationcodes from the calibration codes and configured to select thecalibration codes or the converted calibration codes as the compensationcalibration codes based on an operation mode signal.
 3. The transmittingdevice of claim 2, wherein the calibration code converter comprises: acode decoder configured to generate the converted calibration codes byincreasing or decreasing values of the calibration codes when the numberof codes among the calibration codes having the predetermined level isgreater than or equal to the threshold value; and a code selectorconfigured to output the calibration codes or the converted calibrationcodes as the compensation calibration codes based on the operation modesignal.
 4. The transmitting device of claim 2, wherein the operationmode signal provides an indication that a semiconductor apparatusassociated with the transmission circuit is operating in a low powermode.
 5. The transmitting device of claim 4, wherein the operation modesignal is enabled when the semiconductor apparatus associated with thetransmission circuit is operating in the low power mode.
 6. Thetransmitting device of claim 1, wherein the compensation calibrationcodes include compensation pull-up calibration codes and compensationpull-down calibration codes, and wherein the transmission circuitcomprises: a pre-driver configured to generate a plurality of pull-upsignals based on the input signal and the compensation pull-upcalibration codes and configured to generate a plurality of pull-downsignals based the input signal and the compensation pull-downcalibration codes; and a main driver configured to drive the signaltransmission line based on the plurality of pull-up signals and theplurality of pull-down signals.
 7. The transmitting device of claim 6,wherein a pull-up resistance and a pull-up driving force of the maindriver are adjusted based on the plurality of pull-up signals, andwherein a pull-down resistance and a pull-down driving force of the maindriver are adjusted based on the plurality of pull-down signals.
 8. Atransmitting device comprising: a calibration code generator coupled toan external reference resistance and configured to generate acalibration codes; and a calibration code converter configured togenerate a converted calibration codes from the calibration codes andconfigured to generate a compensation calibration codes from either thecalibration codes or the converted calibration codes based on anoperation mode signal; and a transmission circuit configured to drive asignal transmission line based on an input signal and the compensationcalibration codes.
 9. The transmitting device of claim 8, wherein thecalibration code converter is configured to generate the convertedcalibration codes by incrementally increasing or decreasing values ofthe calibration codes until the number of codes among the calibrationcodes having the predetermined level is less than the threshold value.10. The transmitting device of claim 8, wherein the calibration codeconverter comprises: a code decoder configured to generate the convertedcalibration codes by increasing or decreasing values of the calibrationcodes when the number of codes among the calibration codes having thepredetermined level is greater than or equal to the threshold value; anda code selector configured to output the calibration codes or theconverted calibration codes as the compensation calibration codes basedon the operation mode signal.
 11. The transmitting device of claim 8,wherein the transmission circuit comprises: a pre-driver configured togenerate a plurality of pull-up signals and a plurality of pull-downsignals based on the input signal and the compensation calibrationcodes; and a main driver configured to drive the signal transmissionline based on the plurality of pull-up signals and the plurality ofpull-down signals.
 12. The transmitting device of claim 11, wherein apull-up resistance and a pull-up driving force of the main driver areadjusted based on the plurality of pull-up signals, and wherein apull-down resistance and a pull-down driving force of the main driverare adjusted based on the plurality of pull-down signals.
 13. Atransmitting device comprising: a calibration circuit configured togenerate calibration codes by performing a calibration operation andconfigured to generate compensation calibration codes by changing thecalibration codes when a number of codes among the calibration codeshaving a predetermined level is greater than or equal to a thresholdvalue, such that a number of codes among the compensation calibrationcodes having the predetermined level is less than the threshold value;and a transmission circuit configured to drive a signal transmissionline based on an input signal and the compensation calibration codes,wherein the transmission circuit comprises a main driver having apull-up resistance and a pull-down resistance set based on thecompensation calibration codes.
 14. The transmitting device of claim 13,wherein the calibration circuit is configured to generate thecompensation calibration codes by incrementally increasing or decreasingvalues of the calibration codes such that the pull-up resistance and thepull-down resistance of the main driver become most adjacent to apull-up resistance value and a pull-down resistance value, respectively,that would otherwise be set based on the calibration codes.
 15. Thetransmitting device of claim 13, wherein the calibration circuitcomprises: a calibration code generator coupled to an external referenceresistance, wherein the calibration code generator is configured togenerate the calibration codes; and a calibration code converterconfigured to generate converted calibration codes by increasing ordecreasing values of the calibration codes when the number of codesamong the calibration codes having the predetermined level is greaterthan or equal to the threshold value and configured to generate thecompensation calibration codes from the calibration codes and theconverted calibration codes based on an operation mode signal.
 16. Thetransmitting device of claim 15, wherein the calibration code convertercomprises: a code decoder configured to generate the convertedcalibration codes by increasing or decreasing values of the calibrationcodes when the number of codes among the calibration codes having thepredetermined level is greater than or equal to the threshold value; anda code selector configured to output the calibration codes or theconverted calibration codes as the compensation calibration codes basedon the operation mode signal.
 17. The transmitting device of claim 13,wherein the transmission circuit further comprises a pre-driverconfigured to generate a plurality of pull-up signals and a plurality ofpull-down signals based on the input signal and the compensationcalibration codes, and wherein the main driver is configured to drivethe signal transmission line based on the plurality of pull-up signalsand the plurality of pull-down signals.
 18. The transmitting device ofclaim 17, wherein the pull-up resistance and a pull-up driving force ofthe main driver are adjusted based on the plurality of pull-up signals,and wherein the pull-down resistances and a pull-down driving force ofthe main driver are adjusted based on the plurality of pull-downsignals.